WTW 2009 - Call for Participation

CALL FOR PARTICIPATION

Scope -- Key Dates -- Venue -- Workshop Registration -- Advance Program -- More Information -- Committees

Scope

The Wireless Test Workshop (WTW2008) is an IEEE-sponsored workshop devoted to exploring all issues relating to the design and especially test of wireless circuits and systems. It is the unique workshop dedicated to RF testing. The workshop will be held the day before the VLSI Test Symposium (VTS) 2009.

All topics relating to design and test of RF circuits and systems are of interest, including:

Design-for-testability
RF wafer probing
High frequency test
Yield learning and analysis
Wireless test methodology
Case studies
Wireless system test
Embedded RF circuit test
Standards conformance test
Design characterization and validation
Noise analysis and avoidance
Design-for-manufacturability
Test board related issues
Test equipment and metrology
Alternative test methods
Cost of test
Fault diagnosis and failure analysis

Tutorial and panel proposals will also be considered.

Key Dates

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Advance Rate Online Registration Deadline: Extended to April 24, 2009!

The Venue

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Seascape Beach Resort
California

Located just ten miles south of Santa Cruz, our well-equipped suites and villas have all the appeal of a private beach house, but with the added amenities of a four-diamond resort: room service, maid service and an award-winning restaurant on-site.

Workshop Registration

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WORKSHOP REGISTRATION IS NOW AVAILABLE ONLINE!

For Hotel Reservation information click here.

Advance Program

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Sunday, May 3rd, 2009

7:00am – 8:00am	Registration & Continental Breakfast
8:30am-8:45am	Opening Address	Prog. Chairs: Gen. Chairs:
Session I	Keynote Speaker & Invited Speaker
8:45AM-9:30AM	Keynote Speaker : Challenges and Opportunities in Next Generation RF Transceivers	Krishnamurthy Soumyanath Intel Fellow	Intel
9:30AM-10:00AM	Invited Speaker : mmWave ATE RFIC Production Test	Mark Roos, CEO:Roos Instruments	Roos Instruments
10:00AM-10:30AM	Coffee break/Refreshment
Session II	Mini_tutorial
10:30AM-11:30AM	New Technologies and New Test Methods – LTE and Multi-com Approach	Gennady Farber & Jeff Dralla	Agilent Technologies
11:30AM-12:00PM	ACR BER Correlation to ATE for a COFDM VHF RX	Peter Sarson	Austria Microsystems
12:00PM-1:00PM	Lunch Break
Session III	Panel
1:00PM-2:30PM	Modulation vs CW Test: What Strategies Provide the Lowest COT, Highest Quality, Best Yield, & Shortest Time to Volume?	Ed Paulson: Organizer Bruce Gravens: Moderator	Teradyne
2:30PM-3:00PM	Coffee break/Refreshment
Session IV	Advanced Test Techniques
3:00PM-3:30PM	Protocol Aware HTOL	YC Wong, Andy Evans & Gary Eves	Broadcom
3:30PM-4:00PM	On the Road to 100Gbps Testing: Hitting the 20 Gbps Milestone	David C. Keezer	Georgia Institute of Technology
4:00PM-4:30PM	Progress in On-Chip Microwave/Millimeterwave IC Test.	William Eisenstadt, Byul Hur, Jaeshin Kim, Ming-Che Lee & Said Rami	Univ. of Florida
4:30PM-5:00PM	FFT Windows and Their Effects on Accuracy	Larry Luce	Teradyne
5:00PM-5:30PM	FPGA-Accelerated Baseband Design and Verification of Broadband Wireless Systems	Amirhossein Alimohammad Saeed Fouladi Fard, & Bruce F. Cockburn	Ukalta Engineering University of Alberta

More Information

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Mustapha Slamani
IBM
MailStop 964Z
1000 River Street
Essex Junction, VT, 05452
Tel: (802)-769-0676
E-Mail: Slamanim@us.ibm.com

Committees

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General Chair
R. Aitken,ARM, USA

Program Chair
M. Slamani, IBM, USA

General Co-Chair
S. Ozev, ASU, USA

ProgramCo-Chair
W.R. Eisenstadt, Univ. of Florida, USA

Publicity Chair
A. Khoche, Verigy, USA

Finance Chair
I. Sylla, TI, USA

Program Committee
S. Abdennadher, Intel
K. Arabi, Qualcomm
A. Chatterjee, Georgia Tech.
S. Bernard, LIRMM
J. Bhagat, IBM
E. Acar, Intel
M. Fennelly, Roos Inst,
C. Force, TI
H. Haggag, Intersil
C. Kelma, NXP
Y-Bu Kim, Samsung
S. Lazar, TI
J. Li, Silicon Labs
L. Luce, Teradyne
Y. Makris, Yale Univ.
M. Margala, Univ. of Massachusetts Lowell
C. Montiel, TI
C. Moore, Maxim
U. Natarajan, Intel
R. Rajsuman, SanJose S. Univ.
J. Rivoir, Verigy
G. Roberts, McGill Univ
E. Silva, NSC
F. Taenzler, TI
C. Thibeault, ETS
G. Verma, Qualcomm
T. Xia, Univ. of Vermon

For more information, visit us on the web at: www.wtw2009.tec.ufl.edu/

The 8th Workshop on Test of Wireless Circuits and Systems (WTW 2009 ) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).